ehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test at the 2017 SEMICON West, taking place July 11-13 in San Francisco, California at the Moscone Convention Center (Booth #5381).