J Microtechnology Blog Adapter Substrates Solve Difficult Testing Problem with PHEMT Transistors

Electrical components like field-effect transistors (FET), monolithic microwave integrated circuits (MMIC), and other products pose a problem for microprobing. They lack the signal, ground pads orientation, and spacing needed to use coplanar and coaxial microprobes for precise characterization measurements. J Micro Technology has an adapter substrate that allows a coplanar probe to test pseudomorphic [...]