Source: SOLID STATE TECHNOLOGY

D2S: Advantest and D2S partner to tackle CD uniformity errors for advanced photomasks

D2S announced that it has partnered with Advantest to integrate D2S' Wafer Plane Analysis engine into Advantest's Mask MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) systems.

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Aki Fujimura's photo - Chairman & CEO of D2S

Chairman & CEO

Aki Fujimura

CEO Approval Rating

87/100

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